The Component Detection subpage of the processing method editing wizard displays the editable parameters related to component detection in your Intact Mass Analysis experiment. These parameters vary, depending on the deconvolution algorithm (Xtract or ReSpect) and source spectra (deconvolution) method (Sliding Windows, Auto Peak Detection, or Average Over Selected Retention Time) that you select.
Refer to the following tables for more information about the parameters in each area on the Component Detection page:
- Chromatogram Parameters area parameters
- Source Spectra Method area parameters
- ReSpect deconvolution parameters
- Xtract deconvolution parameters
Select the Show Advanced Parameters checkbox to edit advanced options that are hidden by default. Normally, these advanced parameters do not need to be edited.
On the right side of the Component Detection page, the Chromatogram and Source Spectrum panes display plots for each raw data file in the experiment, with a separate tab for each raw data file.
| No. | Description | No. | Description |
|---|---|---|---|
1 | Parameters tab (processing method editing wizard) | 6 | Calculate XIC checkbox |
2 | Subpage navigation bar | 7 | Show Advanced Parameters checkbox |
3 | Chromatogram Parameters area | 8 | Chromatogram area |
4 | Source Spectra Method area | 9 | Source Spectrum area |
5 | Deconvolution Algorithm area | 10 | Raw data file tabs |