MS/MS - Ardia Data Viewer - MS/MS - Ardia Data Viewer

Depending on your instrument, you might also perform additional stages of mass analysis called tandem MS (MS/MS).

In an MS/MS experiment, you select specific ions for further fragmentation while discarding all other masses. The selected ion is called a precursor (parent) ion and its fragment ions are called product ions. An ion trap mass spectrometer (a mass spectrometer with an ion trap mass analyzer) can perform additional stages of MS/MS (called MSⁿ), where n represents the number of stages of MS performed.

The MS detector can monitor the product ions in either the full-scan mode or the SIM mode. When you set up the MS detector to monitor a specific product ion of a specific precursor (parent) ion, the scan type is called Selected reaction monitoring (SRM).

You can create your own libraries of full-scan MS/MS data to use for matching.

You can display the chromatograms for full-scan MS/MS data in these plot types: TIC, mass range, base peak, or neutral fragment. With the neutral fragment plot type, you must specify the neutral fragments.